Circuit de conversion analogique/numérique et procédé de conversion analogique/numérique

A/D-Wandlerschaltung und A/D-Wandlungsverfahren

A/D converter circuit and A/D conversion method

Abstract

An A/D converter circuit (20) has a first ring delay line (21) and a second ring delay line (25) configured to vary respective characteristics in the same manner relative to a change in the ambient temperature. A reference voltage (Vref), which is free from a change in temperature, is fed as a power supply voltage to the second ring delay line. Digital data produced by the first ring delay line (21) is temperature-compensated by digital data produced by the second ring delay line (25).

Claims

Description

Topics

Download Full PDF Version (Non-Commercial Use)

Patent Citations (2)

    Publication numberPublication dateAssigneeTitle
    US-2005062482-A1March 24, 2005The Regents Of The University Of Colorado, A Body CorporateMatched delay line voltage converter
    US-2005285769-A1December 29, 2005Takuya Harada, Masakiyo Horie, Takuya Honda, Nobuyuki TanakaAnalog-to-digital converter and method of analog-to-digital conversion

NO-Patent Citations (0)

    Title

Cited By (2)

    Publication numberPublication dateAssigneeTitle
    US-8614637-B2December 24, 2013Semiconductor Energy Laboratory Co., Ltd.Semiconductor device having oscillators, counters and comparator
    WO-2017053019-A1March 30, 2017Qualcomm IncorporatedClosed loop linearized vco-based adc